<?xml version="1.0" encoding="UTF-8"?>
<mods xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.loc.gov/mods/v3" version="3.1" xsi:schemaLocation="http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-1.xsd">
  <titleInfo>
    <title>Advances in psychological and educational measurement</title>
  </titleInfo>
  <name type="personal">
    <namePart>Kamp, Leo J.Th. van der</namePart>
  </name>
  <name type="personal">
    <namePart>Gruijter, Dato N. M</namePart>
  </name>
  <typeOfResource>text</typeOfResource>
  <originInfo>
    <place>
      <placeTerm type="text">London</placeTerm>
    </place>
    <publisher>John Wiley</publisher>
    <dateIssued>1976</dateIssued>
    <issuance>monographic</issuance>
  </originInfo>
  <physicalDescription>
    <extent>320p.</extent>
  </physicalDescription>
  <note>Includes index</note>
  <subject>
    <topic>Psychometrics</topic>
  </subject>
  <subject>
    <topic>Education - Statistics</topic>
  </subject>
  <subject>
    <topic>Educational tests and measurements</topic>
  </subject>
  <classification authority="ddc">371.26 ADV-</classification>
  <identifier type="isbn">0-471-01817-1</identifier>
  <recordInfo/>
</mods>
